Al2O3 Silica Photoluminescence Pb centers Stable isotopic tracing Aluminium Anodizing Backscattering spectrometry 7550Ee Oxidation Adsorption Nanostructures Silicon Interface defects RBS Diffusion Atomic force microscopy AFM Energy loss Ion implantation Raman spectroscopy Capillary condensation Sputtering Aluminum Atomic transport Density functional theory 17O Acoustic propreties of solid Amorphous silicon nanoparticles Nuclear reaction analysis Ageing Hysteresis Magnetic anisotropy 2H Channeling Periodic multilayer X-ray diffraction XRD Transparent conductive oxide TCO Magnetic semiconductors Kossel diffraction Measurement AFM Applied physics PIXE ALD XPS ADSORPTION DESORPTION HYSTERESIS Thin films Anatase 7630Lh Epitaxial growth Alloy Nanoparticles Passivation Indium oxide Silicon Carbide Charge exchange Nitridation Zinc oxide 18O Evaluation Analyse par faisceaux d'ions EPR NRP Pulsed laser deposition Metal-insulator transition Oxygen deficiency GaMnAs Magnetization curves Low energy electron diffraction LEED 7550Pp 8140Ef Annealing SiC 13C Topological insulators 6855Jk Gallium oxide Auger Electron Spectroscopy AES Assessment Nuclear resonance profiling NRP Nickel Ion beam analysis Atomic Structure Epitaxy Acoustic Beta-silicon-carbide AC susceptibility Ferromagnetic resonance 3C-SiC 15N Adsorbed layers Silicon carbide 18O resonance Artificial superlattices Amorphous carbon Rutherford backscattering spectrometry RBS Auger electron spectroscopy AES Alloys Growth